Aero-Engine Controller Test Interface: High-Density Mass Interconnect Solution

2025-10-30
Mass Interconnect System

Project Overview

This case details how our V50 Mass Interconnect Platform solved critical testing challenges for aero-engine controllers, providing a robust interface for automated test equipment (ATE) in aviation applications. The solution enabled precise, repeatable testing of multiple engine controller variants with microsecond-level response requirements.

Challenge

● Real-Time Performance Demands: Engine controllers required microsecond-level response speeds with real-time system support

● Signal Complexity: Multiple signal types (digital, analog, power, coaxial) with high precision requirements

● Configuration Flexibility: Numerous controller models with small batch sizes necessitated rapid test adaptation

● Instrument Integration: Expensive test equipment needed efficient interface management

Our Solution
V50 Mass Interconnect Platform Implementation 

● High-Density Configuration: 50-module positions supporting approximately 5,000 signal points

● Modular Signal Integration: Configured with 192P signals, 64P signals, 96P signals, 256P signals, 19P coaxial, and 16-pin power modules

● Instrument Interface: Complete NI PXI system integration with dual 18-slot chassis containing DAQ, waveform generators, switch cards, multimeter cards, and resistance cards

● System Architecture: Lower-level computer using RT system connected via MXI

High-Density Connector

Technical Advantages

● Ultra-High Density: 10,000+ signal channels in single interface

Exceptional Durability: 20,000+ mating cycles ensure long-term reliability

● Rapid Reconfiguration: Adapter-based system enables quick testing transitions between controller variants

● Full Signal Integration: Supports mixed signal types including power, coaxial, and high-speed digital

● Precision Performance: Maintains signal integrity for microsecond-level response measurements

Application Results
The V50 platform created a universal instrument system where all instrument resources were routed to the interface panel, enabling:

● Streamlined Testing: Single adapter changes accommodate new controller testing requirements

● Cost Efficiency: Maximized utilization of expensive test instrumentation

● Operational Simplicity: Easy-to-operate interface requiring minimal operator effort

● Future-Proof Design: Modular architecture supports evolving testing needs


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